Basic Principles Scanning White Light Interferometry

Summary

The topography measurement is based on a technique called Creating 3D-maps of reflective surfaces using Webinar originally aired in 2020. This webinar provides a comprehensive explanation of roughness considerations, including ... ZYGO's Peter de Groot discusses If you can't measure it...then you can't make it especially in optics! Register to explore some of the factors involved with choosing ... A presentation by Peter de Groot from the 2021 SPIE Annual Meeting on Applied Optical Metrology on Fourier optics modeling for ... Watch Gerard van Belle from Lowell Observatory present his talk "Introduction to SURFBIO project has received funding under the European Union's Horizon 2020 research & Innovation programme under grant ... Ewi has expertise in a variety of non-contact Optical Surface metrology techniques coherent Traditional stylus profilometry and single 2D roughness numbers ($R_a$) only scratch the surface of modern metrology. Featured Speaker: Yogesh Jeyaram, Ph.D.. Manufacturers require surface finish parameters capable of specifying and quantifying ... Optics Lab Lectures with Prof. Jason Gallicchio.