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Last Updated: October 18, 2026
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Guest speaker Rick Passey, an expert on Focused Ion Beam Scanning The second technique or second relevant technique we are going to discuss is Presenter: Hui Yuan, CCEM Link for video sited in webinar: youtu.be/G7nXD4RxIIQ. Speaker: Dr. Ben Britton (UBC Department of Materials Engineering) This talk is part of the Characterization @ UBC seminar ... Material characterization is essential to gain fundamental understanding of the (mechanical) behavior of polycrystalline materials. In this joint EDAX-CAMECA webinar the use of chemical information collected together with Electron Backscatter Diffraction Additive manufacturing (AM) has presented a new processing route for structural alloys, allowing for many exciting opportunities ...
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